Sample | Altitude | Counted grains | Ns
|
ρ
s (105 cm−2) |
N
i
|
ρ
i (105 cm−2) |
χ
2
| Age ± 1σ (Ma) | Dpar (μm) | Track length ± 1σ (μm) | Tracks measured |
---|
Bi0704 | 680 | 17 | 159 | 4.625 | 1,837 | 53.438 | 99.81 | 20.3 ± 2.8 | 2.55 | 12.7 ± 2.0 | 39 |
Bi0706 | 1,320 | 16 | 181 | 4.778 | 2,854 | 75.340 | 13.36 | 15.5 ± 2.3 | 2.24 | 11.8 ± 1.9 | 24 |
-
N
s number of spontaneous tracks counted on the sample, ρ
s density of spontaneous tracks, N
i number of induced tracks counted on the glimmer detector, ρ
i density of induced tracks, χ
2 result of the statistical test in %, Dpar measured long axis of etch pits on the polished surface in μm, Mean track length mean length of horizontal confined tracks in μm given with 1σ error